PANTA, G.; SUBEDI, D. Electrical characterization of aluminum (Al) thin films measured by using four- point probe method. Kathmandu University Journal of Science, Engineering and Technology, [S. l.], v. 8, n. 2, p. 31–36, 2013. DOI: 10.3126/kuset.v8i2.7322. Disponível em: https://nepjol.info./index.php/KUSET/article/view/7322. Acesso em: 26 dec. 2024.