Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM

Authors

  • Purna B Pun Trivhuwan University, Depart of Physics, Prithivi Narayan Campus, Pokhara
  • Shobha K Lamichhane Trivhuwan University, Depart of Physics, Prithivi Narayan Campus, Pokhara

DOI:

https://doi.org/10.3126/hj.v2i2.5220

Keywords:

Atomic Force Microscope (AFM) performance, Thermal oxidation, Annealing impurities, Crystal defects

Abstract

The surface contamination affects Atomic Force Microscope (AFM) performance. Thermal agitation during mapping doping, thermal oxidation, annealing impurities and crystal defects promotes the roughness; various kinds of forces on the surface can be detected by the interaction between tip of cantilever and sample. This interaction not only help us to understand the characteristics and morphology of the sample but also useful to measure the surface force of the aluminum sample too.

Key words: Atomic Force Microscope (AFM) performance; Thermal oxidation; Annealing impurities; Crystal defects

The Himalayan Physics

Vol.2, No.2, May, 2011

Page: 76-79

Uploaded Date: 1 August, 2011

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Published

2011-07-31

How to Cite

Pun, P. B., & Lamichhane, S. K. (2011). Nanoscale Measurement of Surface Roughness and the existing Surface Forces of Aluminum by AFM. Himalayan Physics, 2(2), 76–79. https://doi.org/10.3126/hj.v2i2.5220

Issue

Vol. 2 (2011)

Section

Articles

License

The articles published in the Himalayan Physics are distributed under a license CC BY-NC-SA 4.0.