BHATTARAI, J. A non–destructive compositional analysis of thin surface films formed on W–xTa alloys by angle resolved X–ray photoelectron spectroscopy. BIBECHANA, [S. l.], v. 8, p. 8–16, 2012. DOI: 10.3126/bibechana.v8i0.4784. Disponível em: https://nepjol.info./index.php/BIBECHANA/article/view/4784. Acesso em: 21 nov. 2024.