Variation of Total Electron Content (TEC) in the Quite and Disturbed days and their correlation with Geomagnetic Parameters of Lamjung Station in the year of 2015

Authors

  • Basu Dev Ghimire Institutite of Science and Technology , IOST Tribhuvan University
  • Narayan Prasad Chapagain Amrit Campus (ASCOL), Lainchaur
  • Vardhan Basnet St.Xavier’s College, Maitighar, Kathmandu
  • Karan Bhatta National Academic of Science and Technology, Khumaltar
  • Balaram Khadka Nepalese Center for Research in Physical Sciences, Kathmandu,

DOI:

https://doi.org/10.3126/bibechana.v17i0.26249

Keywords:

Total Electron Content, Global Positioning System, Geomagnetic quite and Disturb

Abstract

Total Electron content is measured using a dual frequency GPS receiver in Lamgung (LMJG) Station located at 84.57° longitude and 28.17° latitude of the year 2015 as it is considered as geo-magnetically active year. In this study, diurnal variation of VTEC has been studied separately for quiet and disturbed days and, for the effective study of the case the PRN wise data of VTEC have been also used. The maximum VTEC is seen from 0700 LT to 1100 LT (LT=UT+5.45). PRN wise VTEC is studied taking the lower bound (LB) and upper bound (UB). The correlation of VTEC with Dst index, Kp index and Solar flux have been studied. Positive correlation has been found in disturbed days with Kp index and solar flux but negative correlation with Dst index. Dst index shows positive correlation in quiet days but Kp index shows negative correlation.

BIBECHANA 17(2020) 123-132

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Author Biography

Narayan Prasad Chapagain, Amrit Campus (ASCOL), Lainchaur

Professor of Physics

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Published

2020-01-01

How to Cite

Ghimire, B. D., Chapagain, N. P., Basnet, V., Bhatta, K., & Khadka, B. (2020). Variation of Total Electron Content (TEC) in the Quite and Disturbed days and their correlation with Geomagnetic Parameters of Lamjung Station in the year of 2015. BIBECHANA, 17, 123–132. https://doi.org/10.3126/bibechana.v17i0.26249

Issue

Vol. 17 (2020)

Section

Research Articles

License

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